The International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of nanoelectronic digital, analog, and mixed-signal circuits and systems.

IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) is technically sponsored by IEEE. The conference proceedings are likely to be indexed in databases such as Scopus, Web of Science (WoS), Google Scholar, and others.